"On the effects of temperature on the drop reliability of electronic ..."

Toni T. Mattila, Jue Li, Jorma K. Kivilahti (2012)

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DOI: 10.1016/J.MICROREL.2011.07.085

access: closed

type: Journal Article

metadata version: 2020-02-22

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Toni T. Mattila, Jue Li, Jorma K. Kivilahti:
On the effects of temperature on the drop reliability of electronic component boards. Microelectron. Reliab. 52(1): 165-179 (2012)

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