"An analytical model for hot carrier degradation in nanoscale CMOS suitable ..."

Elie Maricau, Pieter De Wit, Georges G. E. Gielen (2008)

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DOI: 10.1016/J.MICROREL.2008.06.016

access: closed

type: Journal Article

metadata version: 2020-08-05

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Elie Maricau, Pieter De Wit, Georges G. E. Gielen:
An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. Microelectron. Reliab. 48(8-9): 1576-1580 (2008)

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