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"Dynamic NBTI characteristics of PMOSFETs with PE-SiN capping."
C. Y. Lu, Horng-Chih Lin, Y. J. Lee (2007)
- C. Y. Lu, Horng-Chih Lin, Y. J. Lee:
Dynamic NBTI characteristics of PMOSFETs with PE-SiN capping. Microelectron. Reliab. 47(6): 924-929 (2007)
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