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"Measurement and analysis of contact resistance in wafer probe testing."

D. S. Liu, M. K. Shih, W. H. Huang (2007)

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DOI: 10.1016/J.MICROREL.2006.07.091

access: closed

type: Journal Article

metadata version: 2020-02-22

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D. S. Liu, M. K. Shih, W. H. Huang:
Measurement and analysis of contact resistance in wafer probe testing. Microelectron. Reliab. 47(7): 1086-1094 (2007)

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