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"Testing process capability for one-sided specification limit with ..."

P. C. Lin, Wen Lea Pearn (2002)

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DOI: 10.1016/S0026-2714(02)00103-8

access: closed

type: Journal Article

metadata version: 2020-09-18

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P. C. Lin, Wen Lea Pearn:
Testing process capability for one-sided specification limit with application to the voltage level translator. Microelectron. Reliab. 42(12): 1975-1983 (2002)

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