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"Circuit level prediction of device performance degradation due to negative ..."
Rihito Kuroda et al. (2007)
- Rihito Kuroda
, Akinobu Teramoto
, Kazufumi Watanabe, Michihiko Mifuji, Takahisa Yamaha, Shigetoshi Sugawa, Tadahiro Ohmi:
Circuit level prediction of device performance degradation due to negative bias temperature stress. Microelectron. Reliab. 47(6): 930-936 (2007)
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