Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Advances in scanning SQUID microscopy for die-level and package-level ..."

Lee A. Knauss et al. (2003)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(03)00296-8

access: closed

type: Journal Article

metadata version: 2020-10-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/KnaussOWC03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/KnaussOWC03
Lee A. Knauss, Antonio Orozco, Solomon I. Woods, Alfred B. Cawthorne:
Advances in scanning SQUID microscopy for die-level and package-level fault isolation. Microelectron. Reliab. 43(9-11): 1657-1662 (2003)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.