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Lee A. Knauss

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2000 – 2009

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2003
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Lee A. Knauss, Antonio Orozco, Solomon I. Woods, Alfred B. Cawthorne:
Advances in scanning SQUID microscopy for die-level and package-level fault isolation. Microelectron. Reliab. 43(9-11): 1657-1662 (2003)
2001
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Lee A. Knauss, A. B. Cawthorne, N. Lettsome, S. Kelly, S. Chatraphorn, E. F. Fleet, F. C. Wellstood, W. E. Vanderlinde:
Scanning SQUID microscopy for current imaging. Microelectron. Reliab. 41(8): 1211-1229 (2001)

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