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"Experimental and numerical analysis of current flow homogeneity in low ..."

Michael Heer et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.092

access: closed

type: Journal Article

metadata version: 2023-11-10

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Michael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, Winfried Soppa, Bernd Ramler:
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. Microelectron. Reliab. 47(9-11): 1450-1455 (2007)

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