Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Charge trapping and interface states in hydrogen annealed ..."

Y. V. Gomeniuk et al. (2007)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2007.01.025

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/GomeniukNVLLBHPC07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/GomeniukNVLLBHPC07
Y. V. Gomeniuk, A. N. Nazarov, Ya. N. Vovk, V. S. Lysenko, Yi Lu, Octavian Buiu, Steve Hall, R. J. Potter, Paul R. Chalker:
Charge trapping and interface states in hydrogen annealed HfO₂-Si structures. Microelectron. Reliab. 47(4-5): 714-717 (2007)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.