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"Negative bias temperature stress on low voltage p-channel DMOS transistors ..."

S. Gamerith, M. Pölzl (2002)

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DOI: 10.1016/S0026-2714(02)00165-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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S. Gamerith, M. Pölzl:
Negative bias temperature stress on low voltage p-channel DMOS transistors and the role of nitrogen. Microelectron. Reliab. 42(9-11): 1439-1443 (2002)

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