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"Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies."

Donald A. Gajewski et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.02.018

access: closed

type: Journal Article

metadata version: 2021-04-16

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Donald A. Gajewski, Satyaki Ganguly, Scott T. Sheppard, Simon Wood, Jeff B. Barner, Jim W. Milligan, John Palmour:
Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies. Microelectron. Reliab. 84: 1-6 (2018)

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