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"Positive bias temperature instabilities on sub-nanometer EOT FinFETs."

P. C. Feijoo et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.014

access: closed

type: Journal Article

metadata version: 2021-12-24

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P. C. Feijoo, Moonju Cho, Mitsuhiro Togo, E. San Andrés, Guido Groeseneken:
Positive bias temperature instabilities on sub-nanometer EOT FinFETs. Microelectron. Reliab. 51(9-11): 1521-1524 (2011)

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