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"A New sub-micro probing technique for failure analysis in integrated circuits."

D. Faure, C. A. Waggoner (2002)

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DOI: 10.1016/S0026-2714(02)00228-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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D. Faure, C. A. Waggoner:
A New sub-micro probing technique for failure analysis in integrated circuits. Microelectron. Reliab. 42(9-11): 1767-1770 (2002)

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