"Bias dependence of TID induced single transistor latch for 0.13 μm ..."

Shuang Fan et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.10.024

access: closed

type: Journal Article

metadata version: 2023-06-26

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Shuang Fan, Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Dawei Bi, Chao Peng, Lei Song, Lihua Dai:
Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs. Microelectron. Reliab. 56: 1-9 (2016)

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