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"Distribution and generation of traps in ..."

Isodiana Crupi et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt:
Distribution and generation of traps in SiO₂/Al₂O₃ gate stacks. Microelectron. Reliab. 47(4-5): 525-527 (2007)

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