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"Measurement of the hot carrier damage profile in LDMOS devices stressed at ..."

Domenico Corso et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.011

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type: Journal Article

metadata version: 2022-08-30

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Domenico Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino:
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage. Microelectron. Reliab. 47(4-5): 806-809 (2007)

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