"Electrical characteristics and reliability performance of IGBT power ..."

Tao-Chih Chang et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.10.004

access: closed

type: Journal Article

metadata version: 2024-10-06

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Tao-Chih Chang, Chang-Chun Lee, Chia-Ping Hsieh, Sheng-Che Hung, Ren-Shin Cheng:
Electrical characteristics and reliability performance of IGBT power device packaging by chip embedding technology. Microelectron. Reliab. 55(12): 2582-2588 (2015)

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