"Probing negative bias temperature instability using a continuum numerical ..."

S. Chakravarthi et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.10.008

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type: Journal Article

metadata version: 2020-02-22

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S. Chakravarthi, A. T. Krishnan, V. Reddy, S. Krishnan:
Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation. Microelectron. Reliab. 47(6): 863-872 (2007)

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