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"Total ionizing dose reliability of thin SiO2 in PowerMOSFET ..."
Alessandra Cascio, Giuseppe Currò, A. Cavagnoli (2007)
- Alessandra Cascio, Giuseppe Currò, A. Cavagnoli:
Total ionizing dose reliability of thin SiO2 in PowerMOSFET devices. Microelectron. Reliab. 47(4-5): 815-818 (2007)
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