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"Analyses on NVM Circuitry Delay Induced by Source & Drain ..."

Paolo Caprara et al. (2002)

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DOI: 10.1016/S0026-2714(02)00180-4

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/CapraraBBBCCCDFL02
Paolo Caprara, A. Barcella, M. Beltramello, C. Brambilla, S. Cereda, Carlo Caimi, Valentina Contin, V. Daniele, M. Fontana, P. Lucarno:
Analyses on NVM Circuitry Delay Induced by Source & Drain BF₂ Implant. Microelectron. Reliab. 42(9-11): 1509-1511 (2002)

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