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"Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD ..."

David Alvarez et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.041

access: closed

type: Journal Article

metadata version: 2023-02-02

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David Alvarez, Michel J. Abou-Khalil, Christian Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, Junjun Li, Christopher Seguin, Ralph Halbach:
Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectron. Reliab. 46(9-11): 1597-1602 (2006)

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