"The measurement of the dielectric and optical properties of nano thin ..."

Kwang-Su Lee, Toh-Ming Lu, Xicheng Zhang (2003)

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DOI: 10.1016/S0026-2692(02)00139-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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Kwang-Su Lee, Toh-Ming Lu, Xicheng Zhang:
The measurement of the dielectric and optical properties of nano thin films by THz differential time-domain spectroscopy. Microelectron. J. 34(1): 63-69 (2003)

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