"Analog and mixed signal test techniques for SOC development."

Bozena Kaminska, Stephen K. Sunter, Salvador Mir (2005)

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DOI: 10.1016/J.MEJO.2005.06.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Bozena Kaminska, Stephen K. Sunter, Salvador Mir:
Analog and mixed signal test techniques for SOC development. Microelectron. J. 36(12): 1063 (2005)

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