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"Compaction-based concurrent error detection for digital circuits."

Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris (2005)

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DOI: 10.1016/J.MEJO.2005.03.009

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mj/AlmukhaizimDM05
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
Compaction-based concurrent error detection for digital circuits. Microelectron. J. 36(9): 856-862 (2005)

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