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"Power, Thermal, and Reliability Modeling in Nanometer-Scale Microprocessors."

David M. Brooks et al. (2007)

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DOI: 10.1109/MM.2007.58

access: closed

type: Journal Article

metadata version: 2017-05-20

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  persistent URL:
  - https://dblp.org/rec/journals/micro/BrooksDJS07
David M. Brooks, Robert P. Dick, Russ Joseph, Li Shang:
Power, Thermal, and Reliability Modeling in Nanometer-Scale Microprocessors. IEEE Micro 27(3): 49-62 (2007)

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