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"Refueling: Preventing Wire Degradation due to Electromigration."
Jaume Abella et al. (2008)
- Jaume Abella, Xavier Vera, Osman S. Unsal, Oguz Ergin, Antonio González, James W. Tschanz:
Refueling: Preventing Wire Degradation due to Electromigration. IEEE Micro 28(6): 37-46 (2008)
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