"Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors."

Lakshmi S. Vempati et al. (1996)

> Home

Details and statistics

DOI: 10.1109/4.540056

access: closed

type: Journal Article

metadata version: 2022-07-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/VempatiCBJH96
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/VempatiCBJH96
Lakshmi S. Vempati, John D. Cressler, Jeffrey Babcock, Richard C. Jaeger, David L. Harame:
Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors. IEEE J. Solid State Circuits 31(10): 1458-1467 (1996)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.