Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Process-Variation-Tolerant On-Chip CMOS Thermometer for Auto Temperature ..."

Daeyong Shim et al. (2013)

> Home

Details and statistics

DOI: 10.1109/JSSC.2013.2272338

access: closed

type: Journal Article

metadata version: 2021-07-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/ShimJLRJK13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/ShimJLRJK13
Daeyong Shim, Hyunsik Jeong, Hyunjoong Lee, Cyuyeol Rhee, Deog-Kyoon Jeong, Suhwan Kim:
A Process-Variation-Tolerant On-Chip CMOS Thermometer for Auto Temperature Compensated Self-Refresh of Low-Power Mobile DRAM. IEEE J. Solid State Circuits 48(10): 2550-2557 (2013)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.