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"Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process ..."

Islam A. K. M. Mahfuzul et al. (2015)

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DOI: 10.1109/JSSC.2015.2461598

access: closed

type: Journal Article

metadata version: 2022-12-07

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Islam A. K. M. Mahfuzul, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera:
Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring. IEEE J. Solid State Circuits 50(11): 2475-2490 (2015)

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