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"Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process ..."
Islam A. K. M. Mahfuzul et al. (2015)
- Islam A. K. M. Mahfuzul
, Jun Shiomi, Tohru Ishihara
, Hidetoshi Onodera:
Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring. IEEE J. Solid State Circuits 50(11): 2475-2490 (2015)
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