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"A New Technique for Runtime Leakage Reduction and Its Sensitivity and ..."

Sudip Roy, Ajit Pal (2010)

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DOI: 10.1166/JOLPE.2010.1058

access: closed

type: Journal Article

metadata version: 2020-05-22

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Sudip Roy, Ajit Pal:
A New Technique for Runtime Leakage Reduction and Its Sensitivity and Parametric Yield Analysis Under Effective Channel-Length Variation. J. Low Power Electron. 6(1): 80-92 (2010)

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