"Static test compaction for circuits with multiple independent scan chains."

Irith Pomeranz (2016)

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DOI: 10.1049/IET-CDT.2014.0191

access: closed

type: Journal Article

metadata version: 2020-07-14

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Irith Pomeranz:
Static test compaction for circuits with multiple independent scan chains. IET Comput. Digit. Tech. 10(1): 12-17 (2016)

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