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"Current-Voltage Hysteresis Characteristics in MOS Capacitors with ..."

Toshihiro Matsuda et al. (2009)

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DOI: 10.1587/TRANSELE.E92.C.1523

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/MatsudaINIKMO09
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/MatsudaINIKMO09
Toshihiro Matsuda, Shinsuke Ishimaru, Shingo Nohara, Hideyuki Iwata, Kiyotaka Komoku, Takayuki Morishita, Takashi Ohzone:
Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide. IEICE Trans. Electron. 92-C(12): 1523-1530 (2009)

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