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"On Finding Don't Cares in Test Sequences for Sequential Circuits."

Yoshinobu Higami et al. (2006)

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DOI: 10.1093/IETISY/E89-D.11.2748

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/HigamiKPKT06
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  - https://dblp.org/rec/journals/ieicet/HigamiKPKT06
Yoshinobu Higami, Seiji Kajihara, Irith Pomeranz, Shin-ya Kobayashi, Yuzo Takamatsu:
On Finding Don't Cares in Test Sequences for Sequential Circuits. IEICE Trans. Inf. Syst. 89-D(11): 2748-2755 (2006)

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