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"Variation-Tolerance of a 65-nm Error-Hardened Dual-Modular-Redundancy ..."

Chikara Hamanaka et al. (2011)

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DOI: 10.1587/TRANSFUN.E94.A.2669

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/HamanakaYFKKO11
Chikara Hamanaka, Ryosuke Yamamoto, Jun Furuta, Kanto Kubota, Kazutoshi Kobayashi, Hidetoshi Onodera:
Variation-Tolerance of a 65-nm Error-Hardened Dual-Modular-Redundancy Flip-Flop Measured by Shift-Register-Based Monitor Structures. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 94-A(12): 2669-2675 (2011)

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