"Reconfigurable scan architecture for test power and data volume reduction."

Hyunggoy Oh et al. (2017)

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DOI: 10.1587/ELEX.14.20170415

access: open

type: Journal Article

metadata version: 2024-02-27

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  - https://dblp.org/rec/journals/ieiceee/OhKLK17
Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
Reconfigurable scan architecture for test power and data volume reduction. IEICE Electron. Express 14(13): 20170415 (2017)

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