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ORCID"Selective scan slice repetition for simultaneous reduction of test power ..."
YongJoon Kim, Jaeseok Park, Sungho Kang (2009)
- YongJoon Kim, Jaeseok Park, Sungho Kang:
Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume. IEICE Electron. Express 6(20): 1432-1437 (2009)
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