"High-speed electrical testing of multichip ceramic modules."

Dennis G. Manzer et al. (2005)

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DOI: 10.1147/RD.494.0687

access: closed

type: Journal Article

metadata version: 2020-03-13

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Dennis G. Manzer, John P. Karidis, Kathleen M. Wiley, Dominic C. Bruen, Christopher W. Cline, Charles Hendricks, Robert N. Wiggin, Yuet-Ying Yu:
High-speed electrical testing of multichip ceramic modules. IBM J. Res. Dev. 49(4-5): 687-698 (2005)

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