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Dominic C. Bruen

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2000 – 2009

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2005
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Edward J. Yarmchuk, Christopher W. Cline, Dominic C. Bruen:
Latent defect screening for high-reliability glass-ceramic multichip module copper interconnects. IBM J. Res. Dev. 49(4-5): 677-686 (2005)
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Dennis G. Manzer, John P. Karidis, Kathleen M. Wiley, Dominic C. Bruen, Christopher W. Cline, Charles Hendricks, Robert N. Wiggin, Yuet-Ying Yu:
High-speed electrical testing of multichip ceramic modules. IBM J. Res. Dev. 49(4-5): 687-698 (2005)

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