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"An IEEE 1149.1 Compliant Test Control Architecture."

Debaditya Mukherjee, Melvin A. Breuer (1998)

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DOI: 10.1023/A:1008385819898

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/MukherjeeB98
Debaditya Mukherjee, Melvin A. Breuer:
An IEEE 1149.1 Compliant Test Control Architecture. J. Electron. Test. 13(3): 273-297 (1998)

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