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"Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits."

Erik Jan Marinissen, Yervant Zorian (2012)

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DOI: 10.1007/S10836-012-5279-2

access: open

type: Journal Article

metadata version: 2024-02-05

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Erik Jan Marinissen, Yervant Zorian:
Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits. J. Electron. Test. 28(1): 13-14 (2012)

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