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"Multiple-output parity bit signature for exhaustive testing."

Wen-Ben Jone, Sunil R. Das (1990)

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DOI: 10.1007/BF00137393

access: closed

type: Journal Article

metadata version: 2020-09-11

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Wen-Ben Jone, Sunil R. Das:
Multiple-output parity bit signature for exhaustive testing. J. Electron. Test. 1(2): 175-178 (1990)

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