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"BIST TPG for Combinational Cluster Interconnect Testing at Board Level."

Chen-Huan Chiang, Sandeep K. Gupta (2000)

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DOI: 10.1023/A:1008308430051

access: closed

type: Journal Article

metadata version: 2023-09-22

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Chen-Huan Chiang, Sandeep K. Gupta:
BIST TPG for Combinational Cluster Interconnect Testing at Board Level. J. Electron. Test. 16(5): 427-442 (2000)

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