"A BIST-based Solution for the Diagnosis of Embedded Memories Adopting ..."

Davide Appello et al. (2004)

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DOI: 10.1023/B:JETT.0000009315.57771.94

access: closed

type: Journal Article

metadata version: 2021-07-25

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Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda:
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electron. Test. 20(1): 79-87 (2004)

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