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"How remote leaning during crisis affect technostress levels experienced by ..."

Zuheir N. Khlaif et al. (2023)

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DOI: 10.1007/S10639-023-11651-6

access: closed

type: Journal Article

metadata version: 2023-09-14

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  - https://dblp.org/rec/journals/eait/KhlaifKAT23
Zuheir N. Khlaif, Fakher Khalili, Saida Affouneh, Ahmed Tlili:
How remote leaning during crisis affect technostress levels experienced by academicians. Educ. Inf. Technol. 28(9): 11075-11100 (2023)

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