"Delay Defect Characteristics and Testing Strategies."

Kee Sup Kim, Subhasish Mitra, Paul G. Ryan (2003)

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DOI: 10.1109/MDT.2003.1232251

access: closed

type: Journal Article

metadata version: 2021-07-25

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Kee Sup Kim, Subhasish Mitra, Paul G. Ryan:
Delay Defect Characteristics and Testing Strategies. IEEE Des. Test Comput. 20(5): 8-16 (2003)

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