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ORCID"Speed Binning with Path Delay Test in 150-nm Technology."
Bruce Cory, Rohit Kapur, Bill Underwood (2003)
- Bruce Cory, Rohit Kapur, Bill Underwood:
Speed Binning with Path Delay Test in 150-nm Technology. IEEE Des. Test Comput. 20(5): 41-45 (2003)
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