"A Deep-Learning Model of Virtual Test Drivers."

Thomas Pallacci et al. (2024)

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DOI: 10.1109/LCSYS.2024.3408229

access: open

type: Journal Article

metadata version: 2024-12-09

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Thomas Pallacci, Nicola Mimmo, P. Sessa, Roberto Rabbeni:
A Deep-Learning Model of Virtual Test Drivers. IEEE Control. Syst. Lett. 8: 1150-1155 (2024)

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