"Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact ..."

Hyejeong Hong et al. (2015)

> Home

Details and statistics

DOI: 10.1145/2785988

access: closed

type: Journal Article

metadata version: 2024-07-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/csur/HongLLK15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/csur/HongLLK15
Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability. ACM Comput. Surv. 48(1): 9:1-9:25 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.