"On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug."

Hayoung Lee, Hyunggoy Oh, Sungho Kang (2021)

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DOI: 10.1109/ACCESS.2021.3071517

access: open

type: Journal Article

metadata version: 2024-02-27

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Hayoung Lee, Hyunggoy Oh, Sungho Kang:
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access 9: 56443-56456 (2021)

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